Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11590578 | Internal defect detection system, three-dimensional additive manufacturing device, internal defect detection method, method of manufacturing three-dimensional additive manufactured product, and three-dimensional | Ryuichi Narita, Toshiya Watanabe, Akio Kondou, Masashi Kitamura, Hidetaka Haraguchi +2 more | 2023-02-28 |
| 11185925 | Process abnormality detection system for three-dimensional additive manufacturing device, three-dimensional additive manufacturing device, process abnormality detection method for three-dimensional additive manufacturing device, method for manufacturing three-dimensional additive manufactured product, and three-dimensional additive manufactured product | Ryuichi Narita, Toshiya Watanabe, Akio Kondou, Masashi Kitamura, Hidetaka Haraguchi +3 more | 2021-11-30 |