Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5387975 | Interferometer for measuring a surface configuration of a test object by an interference pattern using gratings to generate wave fronts | Futoshi Ishida, Kiyofumi Hashimoto, Toshihide Dohi, Takao Kobayashi | 1995-02-07 |