Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12236576 | Workpiece surface defect detection device and detection method, workpiece surface inspection system, and program | Yoshihito Souma, Taizo Wakimura, Ryuichi Yoshida, Shota Ueki | 2025-02-25 |
| 6853458 | Three-dimensional measuring method and device, and computer program | Tetsuya Katagiri, Fumiya Yagi, Hiroshi Uchino, Yuzuru Tanaka | 2005-02-08 |
| 6847360 | Three-dimensional measuring method and system | — | 2005-01-25 |
| 6614537 | Measuring apparatus and measuring method | — | 2003-09-02 |
| 6529280 | Three-dimensional measuring device and three-dimensional measuring method | Toshio Norita, Eiro Fujii, Fumiya Yagi, Satoru Hirose, Takuto Joko +4 more | 2003-03-04 |
| 6421114 | Three-dimensional information measuring apparatus | Makoto Miyazaki, Tadashi Fukumoto | 2002-07-16 |
| 6297881 | Three-dimensional measurement method and three-dimensional measurement device | Toshio Norita | 2001-10-02 |
| 6141105 | Three-dimensional measuring device and three-dimensional measuring method | Toshio Norita, Eiro Fujii, Fumiya Yagi, Satoru Hirose, Takuto Joko +4 more | 2000-10-31 |
| 5760884 | Distance measuring apparatus capable of measuring a distance depending on moving status of a moving object | Takuto Joko | 1998-06-02 |