Issued Patents All Time
Showing 26–50 of 66 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7425472 | Semiconductor fuses and semiconductor devices containing the same | — | 2008-09-16 |
| 7405463 | Gate dielectric antifuse circuit to protect a high-voltage transistor | John D. Porter | 2008-07-29 |
| 7369379 | Methods, circuits, and applications using a resistor and a Schottky diode | — | 2008-05-06 |
| 7279918 | Methods for wafer level burn-in | — | 2007-10-09 |
| 7215134 | Apparatus for determining burn-in reliability from wafer level burn-in | — | 2007-05-08 |
| 7183792 | Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same | — | 2007-02-27 |
| 7126871 | Circuits and methods to protect a gate dielectric antifuse | John D. Porter | 2006-10-24 |
| 7123042 | Methods, apparatus and systems for wafer-level burn-in stressing of semiconductor devices | — | 2006-10-17 |
| 7119568 | Methods for wafer level burn-in | — | 2006-10-10 |
| 7101738 | Gate dielectric antifuse circuit to protect a high-voltage transistor | John D. Porter | 2006-09-05 |
| 7075763 | Methods, circuits, and applications using a resistor and a Schottky diode | — | 2006-07-11 |
| 7071534 | Antifuse structure and method of use | Shubneesh Batra | 2006-07-04 |
| 7038481 | Method and apparatus for determining burn-in reliability from wafer level burn-in | — | 2006-05-02 |
| 7030458 | Gate dielectric antifuse circuits and methods for operating same | — | 2006-04-18 |
| 6979601 | Methods for fabricating fuses for use in semiconductor devices and semiconductor devices including such fuses | Michael P. Violette | 2005-12-27 |
| 6943575 | Method, circuit and system for determining burn-in reliability from wafer level burn-in | — | 2005-09-13 |
| 6936909 | Gate dielectric antifuse circuit to protect a high-voltage transistor | John D. Porter | 2005-08-30 |
| 6914306 | Electrostatic discharge protection device | — | 2005-07-05 |
| 6894526 | Apparatus for determining burn-in reliability from wafer level burn-in | — | 2005-05-17 |
| 6879018 | Fuse for use in a semiconductor device, and semiconductor devices including the fuse | Michael P. Violette | 2005-04-12 |
| 6867612 | Method for wafer-level burn-in stressing of semiconductor devices and semiconductor device substrates configured to effect the method | — | 2005-03-15 |
| 6836000 | Antifuse structure and method of use | Shubneesh Batra | 2004-12-28 |
| 6809968 | SRAM array with temperature-compensated threshold voltage | John D. Porter | 2004-10-26 |
| 6768617 | Setpoint silicon controlled rectifier (SCR) electrostatic discharge (ESD) core clamp | — | 2004-07-27 |
| 6751150 | Circuits and method to protect a gate dielectric antifuse | John D. Porter | 2004-06-15 |