Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6960767 | Apparatus for measuring features of a semiconductor device | Jeff Johnson | 2005-11-01 |
| 6941007 | Pattern recognition with the use of multiple images | — | 2005-09-06 |
| 6452677 | Method and apparatus for detecting defects in the manufacture of an electronic device | Ted Taylor | 2002-09-17 |
| 6175417 | Method and apparatus for detecting defects in the manufacture of an electronic device | Ted Taylor | 2001-01-16 |
| 6124140 | Method for measuring features of a semiconductor device | Jeff Johnson | 2000-09-26 |