Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11742230 | Contaminant detection tools including nebulizer and related methods | Nicholas A. Wieber | 2023-08-29 |
| 11211272 | Contaminant detection tools and related methods | Nicholas A. Wieber | 2021-12-28 |
| 9196471 | Scanner for wafers, method for using the scanner, and components of the scanner | Yen Choo | 2015-11-24 |
| 8765000 | Microfeature workpiece processing system for, e.g., semiconductor wafer analysis | Ronald Baldner | 2014-07-01 |
| 7763548 | Microfeature workpiece processing system for, e.g., semiconductor wafer analysis | Ronald Baldner | 2010-07-27 |
| 7002144 | Transfer line for measurement systems | Eric Swanson, Larry Weston, Kevin Coyle | 2006-02-21 |