Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10393801 | Fault isolation system and method for detecting faults in a circuit | Wei Wang, Hua Chen | 2019-08-27 |
| 9784788 | Fault isolation system and method for detecting faults in a circuit | Wei Wang, Hua Chen | 2017-10-10 |
| 8426810 | Method of planar imaging on semiconductor chips using focused ion beam | Pei-Yi Chen, Chiu Chu Liu | 2013-04-23 |