AP

Alfred Peer

MG Mettler-Toledo Gmbh: 1 patents #194 of 448Top 45%
📍 Baar, CH: #140 of 230 inventorsTop 65%
Overall (All Time): #3,399,958 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7290434 Method and device for determining the condition of a measuring probe Jürgen Ammann, René Oberlin, Klaus-Dieter Anders, Christian Zwicky 2007-11-06