DL

Dongsong Li

MT Mettler-Toledo (Changzhou) Measurement Technology: 1 patents #38 of 125Top 35%
MI Mettler-Toledo (Changzhou) Precision Instruments: 1 patents #37 of 122Top 35%
MC Mettler-Toledo International Trading (Shanghai) Co.: 1 patents #36 of 119Top 35%
Overall (All Time): #2,572,416 of 4,157,543Top 65%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
D980096 Detection system using x-rays Peng Hui Jiang, Wanchuan Hu, Xu Sun, Liang Zhao, Jian Gong +1 more 2023-03-07