CL

Chin Hui Li

MT Mettler-Toledo (Changzhou) Measurement Technology: 3 patents #12 of 125Top 10%
MI Mettler-Toledo (Changzhou) Precision Instruments: 3 patents #13 of 122Top 15%
MC Mettler-Toledo International Trading (Shanghai) Co.: 3 patents #11 of 119Top 10%
Overall (All Time): #1,366,261 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
D1043390 Weighing device You Yi Wu, Ferenc Muranyi, Tom Leahy 2024-09-24
D1030529 Weighing device You Yi Wu, Ferenc Muranyi, Tom Leahy 2024-06-11
D1030530 Weighing device You Yi Wu, Ferenc Muranyi, Tom Leahy 2024-06-11