SF

Shawn De Foney

MI Metrologic Instruments: 1 patents #147 of 189Top 80%
📍 Haddon Heights, NJ: #20 of 38 inventorsTop 55%
🗺 New Jersey: #41,174 of 69,400 inventorsTop 60%
Overall (All Time): #3,267,878 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8047438 Digital image capture and processing system employing an image formation and detection subsystem having an area-type image detection array supporting periodic occurrance of snap-shot type image acquisition cycles at a high-repetition rate during object illumination Anatoly Kotlarsky, Xiaoxun Zhu, Michael Veksland, Ka Man Au, Patrick Giordano +8 more 2011-11-01