CT

Constatine J. Tsikos

MI Metrologic Instruments: 1 patents #147 of 189Top 80%
📍 Voorhees, NJ: #113 of 228 inventorsTop 50%
🗺 New Jersey: #41,174 of 69,400 inventorsTop 60%
Overall (All Time): #3,463,544 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6969001 METHOD OF SPECKLE-NOISE PATTERN REDUCTION AND APPARATUS THEREFOR BASED ON REDUCING THE SPATIAL-COHERENCE OF THE PLANAR LASER ILLUMINATION BEAM BEFORE IT ILLUMINATES THE TARGET OBJECT BY APPLYING SPATIAL INTENSITY MODULATION TECHNIQUES DURING THE TRANSMISSION OF THE PLIB TOWARDS THE TARGET C. Harry Knowles, Allan Wirth, Timothy Good, Andrew Jankevics 2005-11-29