JL

John Lhamon

MM Memc Electronic Materials: 1 patents #138 of 273Top 55%
Overall (All Time): #3,516,587 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6589332 Method and system for measuring polycrystalline chunk size and distribution in the charge of a Czochralski process John D. Holder, Steven M. Joslin, Hariprasad Sreedharamurthy 2003-07-08