Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9535120 | Integrated circuit and method for establishing scan test architecture in integrated circuit | Jianguo REN, Chong Dai, Fengguo Gao, Shang-Bin Huang | 2017-01-03 |
| 6950999 | Circuitry cross-talk analysis with consideration of signal transitions | You-Ming Chiu | 2005-09-27 |