Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12007380 | Apparatus and method for x-ray fluorescence analysis | Lieven Kempenaers, Youhong Xiao | 2024-06-11 |
| 7042978 | Examination of material samples | Roelof De Lange | 2006-05-09 |
| 5745543 | Apparatus for simultaneous X-ray diffraction and X-ray fluorescence measurements | Pieter Klaas De Bokx, Paul Van Der Sluis | 1998-04-28 |