Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11948292 | Systems and methods for detecting flaws on panels using images of the panels | Andre S. Yoon, Sangwoo Shim, Yongsub Lim, Ki Hyun Kim, Byungchan Kim +1 more | 2024-04-02 |
| 11803177 | Method and apparatus for detecting anomaly data | Sangwoo Shim, Kyounghyun Mo, Young Jae Choung, Jongseob Jeon | 2023-10-31 |
| 11797859 | Environment factor control device and training method thereof | Byungchan Kim, Sangwoo Shim, Sungho Yoon | 2023-10-24 |
| 11156969 | Environment factor control device and training method thereof | Byungchan Kim, Sangwoo Shim, Sungho Yoon | 2021-10-26 |