Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7208328 | Method and system for analyzing defects of an integrated circuit wafer | Shu-Sing Liao | 2007-04-24 |
| 6773933 | Method of boosting wafer cleaning efficiency and increasing process yield | Kent Kuohua Chang | 2004-08-10 |
| 6706612 | Fabrication method for shallow trench isolation | Kent Kuohua Chang | 2004-03-16 |