SJ

Sunwook Jung

MC Macronix International Co.: 1 patents #718 of 1,241Top 60%
Overall (All Time): #3,238,342 of 4,157,543Top 80%
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Patent #TitleCo-InventorsDate
7875198 Method of deriving etching correction values for patterns of photomask and method of fabricating photomask Chao-Lung Lo 2011-01-25