Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12255112 | Test key and semiconductor die including the same | Tse-Pan Yang, Wei-Yang Lee, Jen-Yuan Chang | 2025-03-18 |
| 7362122 | Method and circuit for extracting current-voltage characteristics of device | Wei-Cheng Lin, Yao-Wen Chang | 2008-04-22 |