Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9435847 | Method for testing special pattern and probe card defect in wafer testing | Shih-Hsien Chang, Kai-Wen Tu, Yen-Liang Lin | 2016-09-06 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9435847 | Method for testing special pattern and probe card defect in wafer testing | Shih-Hsien Chang, Kai-Wen Tu, Yen-Liang Lin | 2016-09-06 |