CH

Chih-Hao Huang

MC Macronix International Co.: 13 patents #141 of 1,241Top 15%
ET Ememory Technology: 9 patents #32 of 169Top 20%
CC Cheng Uei Precision Industry Co.: 5 patents #117 of 502Top 25%
NM Novatek Microelectronics: 4 patents #229 of 986Top 25%
WI Wistron: 2 patents #559 of 2,107Top 30%
IT ITRI: 2 patents #3,461 of 9,619Top 40%
NU National Tsing Hua University: 2 patents #327 of 2,036Top 20%
GC Goldtek Technology Co.: 1 patents #7 of 26Top 30%
HT Htc: 1 patents #822 of 1,407Top 60%
SE Seiko Epson: 1 patents #5,551 of 7,774Top 75%
LH Light Polymers Holding: 1 patents #3 of 11Top 30%
Overall (All Time): #82,665 of 4,157,543Top 2%
39
Patents All Time

Issued Patents All Time

Showing 26–39 of 39 patents

Patent #TitleCo-InventorsDate
8324743 Semiconductor device with a structure to protect alignment marks from damage in a planarization process Chiao-Wen Yeh 2012-12-04
8241417 Nanocomposite coating and the method of coating thereof 2012-08-14
8123973 Method of manufacturing magnetic material 2012-02-28
8049345 Overlay mark Chin-Cheng Yang 2011-11-01
8031329 Overlay mark, and fabrication and application of the same 2011-10-04
7988778 Method of making composite coating and product formed with the composite coating 2011-08-02
7927960 Method of improving overlay performance in semiconductor manufacture Chin-Cheng Yang 2011-04-19
7916295 Alignment mark and method of getting position reference for wafer Chiao-Wen Yeh 2011-03-29
7910168 Method for forming a film on a substrate 2011-03-22
7901872 Exposure process and photomask set used therein Chin-Cheng Yang 2011-03-08
7753675 Auxiliary position apparatus for injection molding machine Chien-Hung Liu 2010-07-13
7645546 Method for determining an overlay correlation set Chin-Cheng Yang 2010-01-12
7449792 Pattern registration mark designs for use in photolithography and methods of using the same Chin-Cheng Yang 2008-11-11
7432605 Overlay mark, method for forming the same and application thereof Chin-Cheng Yang 2008-10-07