Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8918416 | Classifying queries | Erik Gross | 2014-12-23 |
| 8756264 | Parallel pseudorandom number generation | William Y. Crutchfield, Matthew Nicholas Papakipos | 2014-06-17 |
| 8423405 | Advertisement selection | Karthik Gopalratnam, Levent Ertoz, Marc Berndl, Dan Liu, Sridhar Ramaswamy +3 more | 2013-04-16 |
| 8271328 | User-based advertisement positioning using markov models | Edward A. Baltz, Khanh B. Nguyen, Ralph U. Gasser, Michael Frumkin, Karthik Gopalratnam +1 more | 2012-09-18 |
| 7586608 | Wafer-level testing of optical and optoelectronic chips | Lawrence C. Gunn, III, Roman Malendevich, Thierry Pinguet, Maxime Jean Rattier, Jeremy Witzens | 2009-09-08 |
| 7412138 | Optoelectronic alignment structures for the wafer level testing of optical and optoelectronic chips | Roman Malendevich, Lawrence C. Gunn, III | 2008-08-12 |
| 7378861 | Optical alignment loops for the wafer-level testing of optical and optoelectronic chips | Roman Malendevich, Lawrence C. Gunn, III | 2008-05-27 |
| 7298939 | Optoelectronic alignment structures for the wafer level testing of optical and optoelectronic chips | Roman Malendevich, Lawrence Cary Gunn III | 2007-11-20 |
| 7262852 | Wafer-level testing of optical and optoelectronic chips | Lawrence C. Gunn, III, Roman Malendevich, Thierry Pinguet, Maxime Jean Rattier, Jeremy Witzens | 2007-08-28 |
| 7224174 | Optical alignment loops for the wafer-level testing of optical and optoelectronic chips | Roman Malendevich, Lawrence C. Gunn, III | 2007-05-29 |
| 7184626 | Wafer-level testing of optical and optoelectronic chips | Lawrence C. Gunn, III, Roman Malendevich, Thierry Pinguet, Maxime Jean Rattier, Jeremy Witzens | 2007-02-27 |
| 7183759 | Optical probes with spacing sensors for the wafer level testing of optical and optoelectronic chips | Roman Malendevich, Lawrence C. Gunn, III | 2007-02-27 |
| 7024066 | Littrow gratings as alignment structures for the wafer level testing of optical and optoelectronic chips | Roman Malendevich, Lawrence C. Gunn, III | 2006-04-04 |