Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7492049 | Multi-layer registration and dimensional test mark for scatterometrical measurement | Phong Do, David Sturdevant | 2009-02-17 |
| 7258953 | Multi-layer registration and dimensional test mark for scatterometrical measurement | Phong Do, David Sturdevant | 2007-08-21 |