| 7106073 |
Method and system for area efficient charge-based capacitance measurement |
Jeffrey S. Sather |
2006-09-12 |
| 6544807 |
Process monitor with statistically selected ring oscillator |
— |
2003-04-08 |
| 6493851 |
Method and apparatus for indentifying causes of poor silicon-to-simulation correlation |
Robert W. Davis |
2002-12-10 |
| 6114903 |
Layout architecture for core I/O buffer |
— |
2000-09-05 |
| 5843813 |
I/O driver design for simultaneous switching noise minimization and ESD performance enhancement |
Hua Wei, Michael J. Colwell |
1998-12-01 |
| 5751161 |
Update scheme for impedance controlled I/O buffers |
Shuran Wei |
1998-05-12 |
| 5654895 |
Process monitor usig impedance controlled I/O controller |
Shuran Wei |
1997-08-05 |
| 5592104 |
Output buffer having transmission gate and isolated supply terminals |
— |
1997-01-07 |
| 4769558 |
Integrated circuit clock bus layout delay system |
— |
1988-09-06 |
| 4760292 |
Temperature compensated output buffer |
— |
1988-07-26 |
| 4701920 |
Built-in self-test system for VLSI circuit chips |
David R. Resnick |
1987-10-20 |
