Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7328386 | Methods for using checksums in X-tolerant test response compaction in scan-based testing of integrated circuits | Mikhail I. Grinchuk, Erik Vaclav Chmelar | 2008-02-05 |
| 7206983 | Segmented addressable scan architecture and method for implementing scan-based testing of integrated circuits | Mikhail I. Grinchuk, Erik Vaclav Chmelar | 2007-04-17 |