Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11979646 | System and method of extracting or inspecting a feature of an object using thermal imaging, and a method of inspecting an object of a garment product | Kin Sun Chan, Yan Nei Law | 2024-05-07 |