Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10060865 | Measurement of critical dimensions of nanostructures using X-ray grazing incidence in-plane diffraction | Ronald D. Ruth, Roderick J. Loewen | 2018-08-28 |
| 5076678 | Laser diode light imaging optics | William M. Grossman, Richard W. Wallace, Leonard P. Pearson | 1991-12-31 |