Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10032167 | Abnormal pattern analysis method, abnormal pattern analysis apparatus performing the same and storage medium storing the same | Kang Hee Lee, Ki Hyun Cho, Seong Jin Yoo | 2018-07-24 |