NJ

Niels de Jonge

FE Fei: 1 patents #375 of 681Top 60%
Philips: 1 patents #3,761 of 7,731Top 50%
UT Ut-Battelle: 1 patents #807 of 1,792Top 50%
VU Vanderbilt University: 1 patents #725 of 1,609Top 50%
📍 Sankt Ingbert, TN: #1 of 1 inventorsTop 100%
Overall (All Time): #712,833 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #TitleCo-InventorsDate
11499967 Specific protein marker and method for identifying the statistic distribution of protein stoichiometry Diana B. Peckys 2022-11-15
10319559 Method and device for testing samples by means of an electron or ion beam microscope Tim Dahmen 2019-06-11
9966223 Device for correlative scanning transmission electron microscopy (STEM) and light microscopy 2018-05-08
9857320 Device and method for the stoichiometric analysis of samples Diana B. Peckys 2018-01-02
9207196 Transmission electron microscopy for imaging live cells 2015-12-08
7777185 Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscope 2010-08-17
7288773 Electron source, and charged-particle apparatus comprising such an electron source Erik Petrus Antonius Maria Bakkers, Louis Felix Feiner, Antonio Calvosa 2007-10-30