Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11639945 | Test probe assembly and test socket | Jae-hwan Jeong, Jung Chul Shin | 2023-05-02 |
| 11150270 | Test device | Jae-hwan Jeong | 2021-10-19 |
| 10884047 | Probe socket | Jae-hwan Jeong, Jung Chul Shin | 2021-01-05 |