Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8479308 | Scanning probe microscope and method for detecting proximity of probes thereof | Katsuhito Nishimura, Yoichi Kawakami, Mitsuru Funato, Tsuneaki Hashimoto | 2013-07-02 |