XD

Xiaoming Dou

KC Kyoto Daiichi Kagaku Co.: 14 patents #2 of 118Top 2%
Overall (All Time): #312,843 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
12038232 Sintering devices and pressure sintering mechanisms with controllable atmosphere thereof Guoqiang Qi, Jiawei Jiang, Youzhi Yang, Yuan LIU 2024-07-16
6887430 Apparatus for immune analysis Yoshinori Yamaguchi, Harumi Uenoyama 2005-05-03
6043034 Method for measuring the concentration of polynucleotides Toshio Takama, Yung Xiang Wang, Masao Kono 2000-03-28
5870188 Measuring method and measuring apparatus by light scattering Yukihiro Ozaki, Yoshinori Yamaguchi, Harumi Uenoyama 1999-02-09
5828450 Spectral measuring apparatus and automatic analyzer Toshio Takama 1998-10-27
5815260 Urogenous component measuring apparatus for qualitatively/quantitatively measuring a plurality of urogenous components Harumi Uenoyama, Yung Xiang Wang, Koji Matsuoka 1998-09-29
5804451 Optical measuring method for mevalonic acid Yung Xiang Wang, Masayuki Yagi 1998-09-08
5796476 Method of optically measuring component in solution Yung Xiang Wang 1998-08-18
5754288 Optical measuring method of expiration components Hiroshi Yamamoto, Harumi Uenoyama, Yung Xiang Wang, Kentaro Shimada 1998-05-19
5754289 Raman scattered light measuring apparatus Yukihiro Ozaki, Yoshinori Yamaguchi, Harumi Uenoyama 1998-05-19
5750410 Method of and apparatus for immune analysis Yoshinori Yamaguchi, Harumi Uenoyama 1998-05-12
5741660 Method of measuring enzyme reaction by Raman scattering Yutaka Yamasaki, Harumi Uenoyama, Yoshinori Yamaguchi 1998-04-21
5712167 Method of measuring Amadori compound by light scattering Yoshinori Yamaguchi, Masayuki Yagi, Harumi Uenoyama 1998-01-27
5617205 Spectral measuring method and spectral measuring apparatus Yoshinori Yamaguchi, Harumi Uenoyama, Yung Xiang Wang 1997-04-01
5481113 Apparatus and method for measuring concentrations of components with light scattering Harumi Uenoyama 1996-01-02