Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6080986 | Secondary ion mass spectrometer with aperture mask | Johann L. Maul | 2000-06-27 |
| 5171987 | Combined magnetic sector mass spectrometer and time-of-flight mass spectrometer | John D. Waldron, Peter Derrick | 1992-12-15 |
| 5164594 | Charged particle extraction arrangement | Stephen Thompson | 1992-11-17 |