WK

Wuon-Shick Kim

KS Korea Research Institute Of Standards And Science: 1 patents #192 of 481Top 40%
Overall (All Time): #2,960,333 of 4,157,543Top 75%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9737284 Phantom for measuring thickness of thin layer using ultrasonic imaging device and method of using thereof Yong Tae Kim, Bong Young Ahn, Il Doh 2017-08-22