Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12152982 | Device and method for multi-reflection solution immersed silicon-based microchannel measurement | Dong Hyung Kim, Won Chegal, Yong Jai Cho | 2024-11-26 |
| 11719624 | Liquid immersion micro-channel measurement device and measurement method which are based on trapezoidal incident structure prism incident-type silicon | Yong Jai Cho, Won Chegal | 2023-08-08 |
| 11493433 | Normal incidence ellipsometer and method for measuring optical properties of sample by using same | Yong Jai Cho, Won Chegal | 2022-11-08 |
| 11402321 | High-sensitive biosensor chip using high extinction coefficient marker and dielectric substrate, measurement system, and measurement method | Dong Hyung Kim, Yong Jai Cho, Won Chegal | 2022-08-02 |
| 10921241 | Oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device and measurement method | Won Chegal, Yong Jai Cho | 2021-02-16 |
| 10458901 | Apparatus and method for simultaneously measuring characteristics of molecular junctions and refractive index of buffer solution | Yong Jai Cho, Won Chegal | 2019-10-29 |
| 10317334 | Achromatic rotating-element ellipsometer and method for measuring mueller-matrix elements of sample using the same | Yong Jai Cho, Won Chegal | 2019-06-11 |
| 10145785 | Optical element rotation type Mueller-matrix ellipsometer and method for measuring Mueller-matrix of sample using the same | Yong Jai Cho, Won Chegal | 2018-12-04 |
| 9581498 | Rotating-element spectroscopic ellipsometer and method for measurement precision prediction of rotating-element spectroscopic ellipsometer, recording medium storing program for executing the same, and computer program stored in medium for executing the same | Yong Jai Cho, Won Chegal | 2017-02-28 |
| 8940538 | Apparatus and method for quantifying binding and dissociation kinetics of molecular interactions | Gal Won Che, Yong Jai Cho | 2015-01-27 |
| 8830463 | Rotating-element ellipsometer and method for measuring properties of the sample using the same | Yong Jai Cho, Won CHE GAL | 2014-09-09 |
| 8705033 | Multi-channel surface plasmon resonance sensor using beam profile ellipsometry | Yong Jai Cho, Won Chegal | 2014-04-22 |
| 8705039 | Surface plasmon resonance sensor using vertical illuminating focused-beam ellipsometer | Yong Jai Cho, Won Chegal | 2014-04-22 |
| 8447546 | Measurement of Fourier coefficients using integrating photometric detector | Yong Jai Cho, Won Chegal | 2013-05-21 |
| 8300221 | Minute measuring instrument for high speed and large area and method thereof | Yong Jai Cho, Won Chegal | 2012-10-30 |
| 8009292 | Single polarizer focused-beam ellipsometer | Yong Jai Choi, Won Chegal | 2011-08-30 |
| 8004677 | Focused-beam ellipsometer | Joong Whan Lee, Young June Ko, Young Sun Park, Yoon Jong Park, Chi Woon Jeong +3 more | 2011-08-23 |