CE

Cheon-Il Eom

KS Korea Research Institute Of Standards And Science: 1 patents #192 of 481Top 40%
Overall (All Time): #3,665,055 of 4,157,543Top 90%
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Patent #TitleCo-InventorsDate
5973786 Method for absolutely measuring the diffraction grating spacing and apparatus thereof Tai Hyun Yoon, Myung Sai Chung 1999-10-26