YL

Young Jeon LEE

KT Korea Institute Of Industrial Technology: 1 patents #279 of 668Top 45%
📍 Cheongju-si, KR: #489 of 787 inventorsTop 65%
Overall (All Time): #2,803,274 of 4,157,543Top 70%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10713478 Behaviour pattern analysis system and method using depth image Sang Kuy Han, Keyoung Jin Chun, Kyu Tae CHANG, Yeung Bae JIN, Kang Jin JEONG +3 more 2020-07-14