JK

Jung Hoon Kong

KAIST: 1 patents #5,996 of 11,619Top 55%
Samsung: 1 patents #49,284 of 75,807Top 70%
Overall (All Time): #2,604,478 of 4,157,543Top 65%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11747250 Impact test apparatus and impact test method Minsang Koo, Do-Kyung Kim, Sanghoon Kim, Seungho Kim, SEONGJIN HWANG +1 more 2023-09-05