Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10481188 | System and method for non-contact measurement of optoelectronic properties of thin film | Minah Seo, Sanghun Lee, Chulki Kim, Q-Han Park, Jinsoo Kim | 2019-11-19 |
| 9110201 | Metamaterial structure | Choongi CHOI | 2015-08-18 |