DS

Donghyeon Son

KAIST: 1 patents #5,996 of 11,619Top 55%
Overall (All Time): #2,933,128 of 4,157,543Top 75%
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Patent #TitleCo-InventorsDate
9581617 Apparatus for scanning nano structure with plural AFM probes and method thereof Jhinhwan Lee 2017-02-28