DK

Dong-uk Kwon

KAIST: 1 patents #5,996 of 11,619Top 55%
Samsung: 1 patents #49,284 of 75,807Top 70%
Overall (All Time): #4,155,802 of 4,157,543Top 100%
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Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10514392 Probe card, test apparatus including the probe card, and related methods of manufacturing Min-woo Rhee, Duke Kimm, Jae Hong Kim, Ji Nyeong Yun, In Kyu Park +4 more 2019-12-24