CL

Chang-Ock Lee

KAIST: 2 patents #4,169 of 11,619Top 40%
Overall (All Time): #1,793,757 of 4,157,543Top 45%
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Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
11547379 Method and apparatus for scatter artifacts correction in industrial 3-dimensional cone beam computed tomography Soomin Jeon 2023-01-10
11080900 Method and apparatus for metal artifact reduction in industrial 3-dimensional cone beam computed tomography Soomin Jeon, Seongeun KIM 2021-08-03