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KAIST: 1 patents #5,996 of 11,619Top 55%
Overall (All Time): #3,780,440 of 4,157,543Top 95%
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Patent #TitleCo-InventorsDate
5452320 Method for detecting fine frequency deviation Young Woo Kim, Chang Ho Jung, Jae Woong Yoon, Kyo II Chung, Kwang-Ha Park 1995-09-19