BL

Bun Lee

KAIST: 14 patents #921 of 11,619Top 8%
LG: 2 patents #13,302 of 26,165Top 55%
📍 Chungju-si, KR: #6 of 157 inventorsTop 4%
Overall (All Time): #301,512 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
7439378 Fulvene, metallocene catalysts and preparation method thereof, and preparation of polyolefines copolymer using the same Young-Whan Park, Si-Geun Lee, Sung-Don Hong, Kwang Ho Song, Boong-Goon Jeong +3 more 2008-10-21
7271277 Fulvene, metallocene catalysts and preparation method thereof, and preparation of polyolefines copolymer using the same Young-Whan Park, Si-Geun Lee, Sung-Don Hong, Kwang Ho Song, Boong-Goon Jeong +3 more 2007-09-18
6625361 Method for forming two thin conductive films isolated electrically from each other on a fiber Sahng Gi Park, Jong-bae Kim, Doo-Hee Cho, Yong Gyu Choi, Kyong Hon Kim 2003-09-23
6410347 Real time epitaxial growth of vertical cavity surface-emitting laser using a reflectometry Jong-Hyeob Baek 2002-06-25
6193900 Method for sensing etch of distributed bragg reflector in real time Jong-Hyeob Baek 2001-02-27
6181843 Optical switch of surface transmission type by one-dimensional array method Jong-Hyeob Baek 2001-01-30
5976903 Method for manufacturing tunable laser Jong-Hyub Baek 1999-11-02
5900056 Method for growing epitaxial layers of III-V compound semiconductors Sung Woo Choi, Jong-Hyeob Baek 1999-05-04
5883911 Surface-emitting laser device Jong-Hyeob Baek, Sung Woo Choi, Jin Hong Lee 1999-03-16
5856206 Method for fabricating bragg reflector using in situ laser reflectometry Jong-Hyeob Baek 1999-01-05
5855669 Method for fabricating grating coupler Jong-Hyeob Baek 1999-01-05
5748319 Method for sensing complete removal of oxide layer from substrate by thermal etching with real time Jong-Hyeob Baek, Sung Woo Choi, Jin Hong Lee 1998-05-05
5705403 Method of measuring doping characteristic of compound semiconductor in real time Jong-Hyeob Baek, Jin Hong Lee, Sung Woo Choi 1998-01-06
5686350 Method for fabricating defect-free compound semiconductor thin film on dielectric thin film Mee-Young Yoon, Jong-Hyeob Baek 1997-11-11
5472505 Apparatus for monitoring films during MOCVD Dug Bong Kim, Jong-Hyeob Baek 1995-12-05
5456206 Method for two-dimensional epitaxial growth of III-V compound semiconductors Mee-Young Yoon, Jong-Hyeob Baek 1995-10-10