Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8610767 | Apparatus for skin imaging, system for skin analysis | Natallia Eduardauna Uzenbajakava, Rachel Estelle Thilwind | 2013-12-17 |
| 8462356 | Apparatus and method for observing the surface of a sample | — | 2013-06-11 |
| 8422007 | Optical measurement device with reduced contact area | — | 2013-04-16 |
| 8269983 | Apparatus for observing the surface of a sample | — | 2012-09-18 |
| 8077319 | Apparatus and a method for observing the surface of a sample | — | 2011-12-13 |
| 7978332 | Optical measurement device | — | 2011-07-12 |
| 7872754 | Optical measurement device | — | 2011-01-18 |
| 7649628 | Optical inspection of test surfaces | — | 2010-01-19 |
| 7554665 | Dual beam set-up for parousiameter | — | 2009-06-30 |
| 7349096 | Scatterometer and a method for observing a surface | — | 2008-03-25 |
| 7248368 | Scatterometer and a method for inspecting a surface | — | 2007-07-24 |
| 6617541 | Laser etching method | Klaus B. Schildbach | 2003-09-09 |
| 6577397 | Scatterometer | — | 2003-06-10 |
| 6451387 | Method of applying a ceramic layer to an under-layer having relatively low melting temperature | — | 2002-09-17 |
| 6025037 | Method of curing a film | Marcus Jozef Van Bommel | 2000-02-15 |
| 5993894 | Method of manufacturing a conductive layer on a substrate | Johannes H. W. G. Den Boer, Claudia Mutter, Henricus X. Willems | 1999-11-30 |
| 5460451 | Pyrometer including an emissivity meter | — | 1995-10-24 |
| 5406042 | Device for and method of providing marks on an object by means of electromagnetic radiation | Adrianus R. C. Engelfriet, Gerrit C. Verkade | 1995-04-11 |
| 4726047 | X-ray analysis apparatus | Geert Brouwer | 1988-02-16 |
| 4684251 | Spectrometer | Geert Brouwer | 1987-08-04 |