Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6393915 | Method and device for simultaneously measuring multiple properties of multilayer films | Matthew Banet | 2002-05-28 |
| 6122064 | Method for measuring thickness of films | Matt Banet | 2000-09-19 |