MP

Menno Willem Jose Prins

Philips: 24 patents #65 of 7,731Top 1%
Koniniklijke Philips N.V.: 23 patents #200 of 7,486Top 3%
U.S. Philips: 7 patents #535 of 8,851Top 7%
TE Technische Universiteit Eindhoven: 5 patents #3 of 201Top 2%
SB Siemens Healthineers Nederland B.V.: 2 patents #5 of 29Top 20%
LB Liquavista B.V.: 1 patents #18 of 82Top 25%
Samsung: 1 patents #49,284 of 75,807Top 70%
📍 Rosmalen, NL: #1 of 94 inventorsTop 2%
Overall (All Time): #33,377 of 4,157,543Top 1%
65
Patents All Time

Issued Patents All Time

Showing 51–65 of 65 patents

Patent #TitleCo-InventorsDate
6961167 Display device based on frustrated total internal reflection Hugo Johan Cornelissen 2005-11-01
6473492 Multi-fluid elements device with controllable fluid level by means of matrix addressing Edward Willem Albert Young, Jeroen Van Velzen 2002-10-29
6453013 X-ray apparatus provided with a filter with a dynamically adjustable absorption 2002-09-17
6438211 X-ray apparatus including a filter with filter elements having an adjustable absorptivity Johannus Wilhelmus Weekamp 2002-08-20
6430265 X-ray apparatus including a filter provided with filter elements having an adjustable absorption Edward Willem Albert Young, Jeroen Van Velzen, Brian K. Herbert 2002-08-06
6426999 X-ray apparatus including a filter provided with filter elements having an adjustable absorption 2002-07-30
6424698 Filter and X-ray examination apparatus Johannus Wilhelmus Weekamp, Adrianus Cornelius Van Kasteren, Jacobus Bernardus Giesbers, Bartholomeus Petrus Hendricus Van Nunen 2002-07-23
6370228 X-ray filter and x-ray examination apparatus using the same Alan J. Mockler, Johannes Wilhelmus Weekamp 2002-04-09
6289081 Method of manufacturing a filter, a filter thus manufactured and an X-ray examination apparatus Johannus Wilhelmus Weekamp, Jacobus Bernardus Giesbers, Bartholomeus Peter Hendricus Van Nunen, Adrainus Cornelius Van Kasteren 2001-09-11
6275568 X-ray examination apparatus Johannus Wilhelmus Weekamp, Jacobus Bernardus Giesbers, Michel C.J.M. Vissenberg, Coenraad A. A. M. Vugts 2001-08-14
6252939 X-ray examination apparatus including an X-ray filter Edward Willem Albert Young, Johannes Wilhelmus Weekamp, Jacobus Bernardus Giesbers, Petrus W. J. Linders, Andreas C. M. Van Nes 2001-06-26
6226355 X-ray examination apparatus including an X-ray filter 2001-05-01
6198806 X-ray examination apparatus having an adjustable X-ray filter 2001-03-06
6181774 X-ray examination apparatus including an X-ray filter Jacobus Bernardus Giesbers, Johannes Wilhelmus Weekamp, Theodorus J. A. M. Jans, Wilhelmus Jacobus Johannes Welters, Nicolaas Petrus Willard 2001-01-30
5796102 Measuring device for measuring the intensity and/or polarization of electromagnetic radiation, for determining physical properties of a preparation, and for reading information from a storage medium Herman Van Kempen, Daniel Lee Abraham, Ronald Jansen, Maurice C. M. M. van der Wielen 1998-08-18