Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7382141 | Testing a batch of electrical components | Jaruwan Sithisaksawat | 2008-06-03 |
| 7218093 | Reduced chip testing scheme at wafer level | Pieter Cornelis Nicolaas Scheurwater | 2007-05-15 |
| 7035749 | Test machine for testing an integrated circuit with a comparator | — | 2006-04-25 |
| 6833722 | Electronic circuit device with a short circuit switch using transistors and method of testing such a device | Yizi Xing | 2004-12-21 |