Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6088712 | Method of automating the manipulation and displaying of sets of wafer yield data using a user interface smart macro | Yong Zeng, Yu ZHANG | 2000-07-11 |
| 5030907 | CAD driven microprobe integrated circuit tester | Christopher Yih, Tsen-Shau Yang, Ger-Chih Chou | 1991-07-09 |