Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11710227 | Design-to-wafer image correlation by combining information from multiple collection channels | Sunil Varkey | 2023-07-25 |
| 10677742 | Detecting die repeating programmed defects located in backgrounds with non-repeating features | — | 2020-06-09 |